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  • Clock Aging Issues at Sub-10nm Nodes

    ➀ Semiconductor chips are tested for reliability before shipment, but clock aging is a subtle reliability effect that may only appear in the long term;

    ➁ 7nm SoC can have up to 10 billion transistors, and clock aging issues can result in jitter, duty cycle distortion, and increased process variation;

    ➂ Transistor aging is caused by Hot Carrier Injection (HCI), Negative Base Temperature Instability (NBTI), and Positive Base Temperature Instability (PBTI), and Infinisim's ClockEdge tool can analyze clock aging impacts efficiently;

    ➃ The ClockEdge tool simulates fresh and aged results to help designers assess the reliability of their designs.

    semiconductor