04/01/2025, 07:21 AM UTC
SFA为HBM和玻璃基板供应商提供检测套件SFA supplies inspection kit for HBM and glass substrates to major chipmaker
SFA已开发出三种不同的计量和检测（MI）机器，并将其中的之一供应给了一家主要韩国芯片制造商。
公司已向该集团供应了一台基于白光干涉仪（WLI）的高度测量机，并计划再供应四台额外的设备。
SFA has developed three different kinds of metrology and inspection (MI) machines and has supplied one of them to a major South Korean chipmaker.
The company has supplied a white light interferometry (WLI)-based height measurement machine to the conglomerate and plans to supply four additional units.
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