07/10/2024, 01:10 PM UTC
西门子推出5纳米节点集成电路缺陷诊断工具Siemens IC defect diagnosis tool for 5nm node
1、西门子数字工业软件推出了一款用于5纳米节点快速晶体管级扫描链缺陷隔离的工具；2、该工具将诊断分辨率提高了1.5倍以上，减少了大量故障分析的需求；3、Tessent Hi-Res Chain采用布局感知和单元感知技术，精确定位缺陷位置和机制。1. Siemens Digital Industries Software introduces a tool for rapid transistor-level isolation of scan chain defects at 5nm nodes; 2. The tool enhances diagnosis resolution by over 1.5x, reducing the need for extensive failure analysis; 3. Tessent Hi-Res Chain uses layout-aware and cell-aware technology to pinpoint defect locations and mechanisms.
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