04/17/2025, 07:53 AM UTC
开发高灵敏度硬X射线光谱仪Development of a Sensitive Spectrometer for Hard X-ray Radiation
欧洲XFEL的研究人员开发了一种新的硬X射线光测量设备，称为劳埃光谱仪。它能够以高精度和效率检测超过15千电子伏特的光子能量。这对于研究具有技术重要性的材料至关重要，例如那些能够无损耗地传输电力或提高化学反应效率的材料。
传统的X射线光谱仪在布拉格几何下工作，X射线被平行于表面的原子平面弯曲，类似于镜子反射可见光。然而，在高能级时，大部分硬X射线光会穿过晶体而不被使用，降低了传统光谱仪的性能。欧洲XFEL的FXE实验站开发的新的劳埃光谱仪通过在劳埃几何下工作来解决这个问题，其中X射线穿过晶体并垂直于表面被原子层弯曲。这使得新的劳埃分析仪在高能级时效率更高。
新开发的设备称为高能劳埃X射线发射光谱仪（HELIOS），现在可供欧洲XFEL的所有用户使用。它在约18.6千电子伏特的光子能量下提供了极高的精度约为1.2 x 10^-4，与传统光谱仪相 比，信号强度高达4到22倍。这使得可以检测到所谓的4d过渡金属中特别有趣的电子跃迁，这些跃迁通常很难测量。
Researchers at the European XFEL have developed a new measuring device for hard X-ray light, known as a Laue spectrometer. It can detect photon energies over 15 kiloelectronvolts with high precision and improved efficiency. This is important for the study of technologically significant materials, such as those capable of transporting electricity without loss or enhancing the efficiency of chemical processes.
Traditional X-ray spectrometers operate in the Bragg geometry, where X-rays are bent by parallel atom planes, similar to mirrors reflecting visible light. However, at high energies, much of the hard X-ray light passes through the crystal unused, reducing the performance of conventional spectrometers. The new Laue spectrometer developed at the FXE experimental station at the European XFEL addresses this issue by working in the Laue geometry, where X-rays pass through the crystal and are bent by atomic layers perpendicular to the surface. This makes the new Laue analyzer more efficient at higher X-ray energies.
The newly developed device, called the High Energy Laue X-ray Emission Spectrometer (HELIOS), is now available to all users at the European XFEL. It offers an extremely high precision of about 1.2 x 10^-4 at a photon energy of about 18.6 keV, reaching 4 to 22 times higher signal strength compared to conventional spectrometers. This allows the detection of particularly interesting electronic transitions in so-called 4d-transition metals, which are otherwise very difficult to measure.
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