03/24/2025, 05:48 AM UTC
高功率芯片的下一代测试仪Next-Generation Tester For High-Power Chips
➀ MICROTEST推出了VIP ULTRA测试仪，这是其VIP Extended产品线的最新成员，专门用于测试由碳化硅（SiC）和氮化镓（GaN）制成的宽带隙（WBG）器件。
➁ VIP ULTRA支持多种配置，电压能力可达1.7kV或4kV，电流容量高达250A，并提供高并行性以测试高功率芯片。
➂ 这款先进的测试仪特别适用于在硅晶圆级测试高功率芯片，在芯片分割和集成前确保其功能，满足汽车和工业领域不断增长的需求。
➀ MICROTEST has introduced the VIP ULTRA tester, the latest addition to its VIP Extended product line, designed specifically for testing Wide Band Gap (WBG) devices made from Silicon Carbide (SiC) and Gallium Nitride (GaN).
➁ The VIP ULTRA supports multiple configurations with voltage capabilities of 1.7kV or 4kV and current capacities up to 250A, offering high parallelism for testing high-power chips.
➂ This advanced tester is particularly effective for testing high-power chips at the silicon wafer level, ensuring functionality before chip dicing and integration, driven by increasing demands in automotive and industrial sectors.
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